As part of its cooperation with industry, the Institute works with, among others.
- the electrical machine manufacturers EMIT and BESEL, which belong to the Cantoni Motor company,
- companies of the ABB Sp. z o.o. concern
- SEW-EURODRIVE company,
- ZREW company.
As part of cooperation with foreign countries, research is conducted with, among others
- research centre of the OTIS United Technologies concern (USA),
- TurboCare Poland S.A. company of Westinghouse Electric Corporation,
- the BSH Sp. z o.o. plant. Domestic Appliances.
Thanks to cooperation with industrial plants, the Institute's laboratories are equipped with state-of-the-art drives and controller solutions from SIEMENS and SEW. Cooperation with IBM Polska has resulted in the construction of a specialised computer laboratory, equipped with equipment from this company, which is used to conduct workshops and seminars. Thanks to IBM's support, the Institute was awarded international certification under the Prometic system.
The Institute also houses the highly specialised laboratories for environmental electrotechnology, the laboratories for plasma synthesis of nanomaterials and the so-called Clean Zone Stand, which is the basis of the Microscopy Laboratory.
Housed at the Institute, the JEOL JSM-IT200 In-Touch-Scope scanning electron microscope is a state-of-the-art column microscope equipped with a tungsten cathode electron gun, offering a full range of functions. It has a range of solutions for working with any type of material under examination. The electron optics system of the In-Touch-Scope™ microscope is equipped with a precentred tungsten cathode electron gun and a conical Wehnelt cylinder assembly. This solution maximises the capabilities of the tungsten cathode, ensuring an exceptionally bright and coherent electron beam without the need for high emission currents. The In-Touch-Scope™ instrument is capable of observation and testing over a wide and continuously variable range of accelerating voltage values: from 500 V to 20 kV.
The instrument is equipped with a secondary electron (SE) detector that allows the topography of the preparation to be imaged, making it possible to study preparations in their native state, their breakthroughs, etc. With the SE detector, it is also possible to collect BSE (backscattered electrons) images when the grating of the SE detector is inversely polarised.
The combination of the JSM-IT200 microscope with the JED-2300/2300F X-ray microanalyser allows not only the precise analysis of the structure of the samples under investigation, but also the chemical composition, which enables analysis at the molecular level. This combination guarantees simultaneous evaluation of structure and composition, which makes it possible to determine not only the exact applicability, but also the possibility of modifying the tested sample with regard to the designated design target. It is also possible to test samples of non-conductive materials after coating the surface with a conductive material, which is made possible by the sputtering unit included in the kit.